Element Specific Monolayer Depth Profiling. (8th August 2014)

• Record Type: Journal Article
• Authors: Macke, Sebastian; Radi, Abdullah; Hamann‐Borrero, Jorge E.; Verna, Adriano; Bluschke, Martin; Brück, Sebastian; Goering, Eberhard; Sutarto, Ronny; He, Feizhou; Cristiani, Georg; Wu, Meng; Benckiser, Eva; Habermeier, Hanns‐Ulrich; Logvenov, Gennady; Gauquelin, Nicolas; Botton, Gianluigi A.; Kajdos, Adam P.; Stemmer, Susanne; Sawatzky, George A.; Haverkort, Maurits W.; Keimer, Bernhard; Hinkov, Vladimir
• Is Part Of: Advanced materials. Volume 26:Number 38(2014)
• Page Start: 6554
• Page End: 6559
• Publication Date: 2014-08-08
• Subjects: Materials -- Periodicals; Chemical vapor deposition -- Periodicals; 620.11
• DOI: 10.1002/adma.201402028
• Languages: English
• ISSNs: 0935-9648

Abstract

<abstract abstract-type="graphical" xml:lang="en" id="adma201402028-abs-0001"> <title> <x xml:space="preserve">Abstract</x> </title> <p> <bold>The electronic phase behavior and functionality</bold> of interfaces and surfaces in complex materials are strongly correlated to chemical composition profiles, stoichiometry and intermixing. Here a novel analysis scheme for resonant X‐ray reflectivity maps is introduced to determine such profiles, which is element specific and non‐destructive, and which exhibits atomic‐layer resolution and a probing depth of hundreds of nanometers. <boxed-text content-type="graphic" position="anchor" orientation="portrait"><graphic position="anchor" mimetype="image" xlink:href="ark:/27927/pgh1fbr9svm" orientation="portrait" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /></boxed-text></p> </abstract>