Element Specific Monolayer Depth Profiling. (8th August 2014) - Macke, Sebastian
Abstract The electronic phase behavior and functionality of interfaces and surfaces in complex materials are strongly correlated to chemical composition profiles, stoichiometry and intermixing. Here a novel analysis scheme for resonant X‐ray reflectivity maps is introduced to determine such profiles, which is element specific and non‐destructive, and which exhibits atomic‐layer resolution and a probing depth of hundreds of nanometers.