Cite
APA Citation
Marcott, C., Lo, M., Hu, Q., Kjoller, K., & Prater, C. B. (n.d.). nanoscale Organic Defect Characterization with AFM-IR. Microscopy and microanalysis, 20, 2056–2057. http://access.bl.uk/ark:/81055/vdc_100024908634.0x000026
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Marcott, C., Lo, M., Hu, Q., Kjoller, K., & Prater, C. B. (n.d.). nanoscale Organic Defect Characterization with AFM-IR. Microscopy and microanalysis, 20, 2056–2057. http://access.bl.uk/ark:/81055/vdc_100024908634.0x000026