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APA Citation
Schäfer, N., Klaus, M., Genzel, C., Marquart, J., Schorr, S., Rissom, T., Wilkinson, A., Schulli, T., Schmid, T., & Abou-Ras, D. (n.d.). comparison of Techniques for Strain Measurements in CuInSe2 Absorber Layers of Thin-film Solar Cells. Microscopy and microanalysis, 20, 1464–1465. http://access.bl.uk/ark:/81055/vdc_100024908220.0x00004a