Cite
MLA Citation
R. Prakash Kolli and Frederick Meisenkothen. “A Focused Ion Beam Specimen Preparation Method to Minimize Gallium Ion Concentration in Copper Atom-Probe Tomography Specimen Tips.” Microscopy and microanalysis, vol. 20, n.d., pp. 350–351. http://access.bl.uk/ark:/81055/vdc_100024907597.0x00005e