Cite
MLA Citation
H. Sawada et al.. “Resolving 45 pm with 300 kV Aberration Corrected STEM.” Microscopy and microanalysis, vol. 20, n.d., pp. 124–125. http://access.bl.uk/ark:/81055/vdc_100024907385.0x000053
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H. Sawada et al.. “Resolving 45 pm with 300 kV Aberration Corrected STEM.” Microscopy and microanalysis, vol. 20, n.d., pp. 124–125. http://access.bl.uk/ark:/81055/vdc_100024907385.0x000053