Cite
APA Citation
Phillips, P. J., Paulauskas, T., Rowlands, N., Nicholls, A. W., Low, K., Bhadare, S., & Klie, R. F. (n.d.). a New Silicon Drift Detector for High Spatial Resolution STEM-XEDS: Performance and Applications. Microscopy and microanalysis, 20, 1046–1052. http://access.bl.uk/ark:/81055/vdc_100024891326.0x000055