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HARVARD Citation
Phillips, P. et al. (n.d.). A New Silicon Drift Detector for High Spatial Resolution STEM-XEDS: Performance and Applications. Microscopy and microanalysis. pp. 1046-1052. [Online].
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Phillips, P. et al. (n.d.). A New Silicon Drift Detector for High Spatial Resolution STEM-XEDS: Performance and Applications. Microscopy and microanalysis. pp. 1046-1052. [Online].