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HARVARD Citation
Jacques, E. et al. (n.d.). Analysis of carrier injection in Si nanoparticle‐SiOx film based MOS devices. Physica status solidi. 11 (2), pp. 206-210. [Online].
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Jacques, E. et al. (n.d.). Analysis of carrier injection in Si nanoparticle‐SiOx film based MOS devices. Physica status solidi. 11 (2), pp. 206-210. [Online].