Relative angular precision in electron backscatter diffraction: A comparison between cross correlation and Hough transform based analysis. Issue 6 (30th May 2014)

• Record Type: Journal Article
• Authors: Chekhonin, Paul; Engelmann, Jan; Oertel, Carl‐Georg; Holzapfel, Bernhard; Skrotzki, Werner
• Is Part Of: Crystal research and technology. Volume 49:Issue 6(2014:Jun.)
• Page Start: 435
• Page End: 439
• Publication Date: 2014-05-30
• Subjects: Crystallography -- Periodicals; 548
• DOI: 10.1002/crat.201400075
• Languages: English
• ISSNs: 0232-1300

Abstract

<abstract abstract-type="graphical" xml:lang="en" id="crat201400075-abs-0001"> <title> <x xml:space="preserve">Abstract</x> </title> <p>In the present study the relative angular resolution of an electron backscatter diffraction system based on Hough transform evaluation was determined and compared with high resolution electron backscatter diffraction. A test measurement on a BaFe₂As₂ thin film provides clear evidence that the angular resolution is better than 0.1°. Only in some specimen areas with strain inhomogeneities deviations are observable. <boxed-text content-type="graphic" position="anchor" orientation="portrait"><graphic position="anchor" mimetype="image" xlink:href="ark:/27927/pghh505fvt" orientation="portrait" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /></boxed-text></p> </abstract>