Relative angular precision in electron backscatter diffraction: A comparison between cross correlation and Hough transform based analysis. Issue 6 (30th May 2014) - Chekhonin, Paul
Abstract In the present study the relative angular resolution of an electron backscatter diffraction system based on Hough transform evaluation was determined and compared with high resolution electron backscatter diffraction. A test measurement on a BaFe2As2 thin film provides clear evidence that the angular resolution is better than 0.1°. Only in some specimen areas with strain inhomogeneities deviations are observable.