Cite
MLA Citation
Tomohito Tanaka et al.. “Ga‐focused ion beam time‐of‐flight secondary ion mass spectrometer analysis of the grain boundary segregation/precipitation of boron in steel.” Surface and interface analysis, vol. 46, 2014, pp. 297–300. http://access.bl.uk/ark:/81055/vdc_100024824223.0x000054