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HARVARD Citation
Grundmann, M. et al. (n.d.). X‐ray multiple diffraction of ZnO substrates and heteroepitaxial thin films. Physica status solidi. 251 (4), pp. 850-863. [Online].
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Grundmann, M. et al. (n.d.). X‐ray multiple diffraction of ZnO substrates and heteroepitaxial thin films. Physica status solidi. 251 (4), pp. 850-863. [Online].