X‐ray multiple diffraction of ZnO substrates and heteroepitaxial thin films. Issue 4 (27th January 2014)
- Record Type:
- Journal Article
- Title:
- X‐ray multiple diffraction of ZnO substrates and heteroepitaxial thin films. Issue 4 (27th January 2014)
- Main Title:
- X‐ray multiple diffraction of ZnO substrates and heteroepitaxial thin films
- Authors:
- Grundmann, Marius
Scheibe, Michael
Lorenz, Michael
Bläsing, Jürgen
Krost, Alois - Abstract:
- <abstract abstract-type="main" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <sec id="pssb201350297-sec-0001" sec-type="section"> <p>We investigate Umweganregung reflections (X‐ray multiple reflections) for <alternatives><inline-graphic mimetype="image" xlink:href="ark:/27927/pgg5f9jbb9h" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /><mml:math altimg="urn:x-wiley:15213951:media:pssb201350297:pssb201350297-math-0001" display="inline" overflow="scroll" xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mo stretchy="false">(</mml:mo><mml:mi mathvariant="italic">HK</mml:mi><mml:mo>.</mml:mo><mml:mi>L</mml:mi><mml:mo stretchy="false">)</mml:mo><mml:mo>=</mml:mo><mml:mo stretchy="false">(</mml:mo><mml:mn>00.1</mml:mn><mml:mo stretchy="false">)</mml:mo></mml:math></alternatives>, (00.3), and (00.5) for a number of wurtzite structure ZnO samples, namely various bulk crystals (substrates), two ZnO thin films and a ZnO:Mg thin film, grown by pulsed laser deposition on a‐plane sapphire. Using a low divergence setup, we achieve a high angular resolution of 0.1<alternatives><inline-graphic mimetype="image" xlink:href="ark:/27927/pgg5f9jbbb2" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /><mml:math altimg="urn:x-wiley:15213951:media:pssb201350297:pssb201350297-math-0002" display="inline" overflow="scroll" xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mtext>deg</mml:mtext></mml:math></alternatives> or better. We derive an<abstract abstract-type="main" xml:lang="en"> <title> <x xml:space="preserve">Abstract</x> </title> <sec id="pssb201350297-sec-0001" sec-type="section"> <p>We investigate Umweganregung reflections (X‐ray multiple reflections) for <alternatives><inline-graphic mimetype="image" xlink:href="ark:/27927/pgg5f9jbb9h" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /><mml:math altimg="urn:x-wiley:15213951:media:pssb201350297:pssb201350297-math-0001" display="inline" overflow="scroll" xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mo stretchy="false">(</mml:mo><mml:mi mathvariant="italic">HK</mml:mi><mml:mo>.</mml:mo><mml:mi>L</mml:mi><mml:mo stretchy="false">)</mml:mo><mml:mo>=</mml:mo><mml:mo stretchy="false">(</mml:mo><mml:mn>00.1</mml:mn><mml:mo stretchy="false">)</mml:mo></mml:math></alternatives>, (00.3), and (00.5) for a number of wurtzite structure ZnO samples, namely various bulk crystals (substrates), two ZnO thin films and a ZnO:Mg thin film, grown by pulsed laser deposition on a‐plane sapphire. Using a low divergence setup, we achieve a high angular resolution of 0.1<alternatives><inline-graphic mimetype="image" xlink:href="ark:/27927/pgg5f9jbbb2" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /><mml:math altimg="urn:x-wiley:15213951:media:pssb201350297:pssb201350297-math-0002" display="inline" overflow="scroll" xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mtext>deg</mml:mtext></mml:math></alternatives> or better. We derive an analytical formula for peak positions as a function of wavelength <alternatives><inline-graphic mimetype="image" xlink:href="ark:/27927/pgg5f9jbbd5" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /><mml:math altimg="urn:x-wiley:15213951:media:pssb201350297:pssb201350297-math-0003" display="inline" overflow="scroll" xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mi>λ</mml:mi></mml:math></alternatives> and the lattice parameters <italic>a</italic> and <italic>c</italic>. The three investigated ZnO substrates exhibit all expected (kinematically allowed) reflections for Cu K<sub>α1</sub>, K<sub>α2</sub>, and K<sub>β</sub>. A lineshape analysis of the multiple reflection peaks shows that the width of certain reflections is determined by the spectral linewidth of the exciting copper lines. The thin films exhibit only slight broadening of the peaks but disappearance of several reflections. The <italic>a</italic> lattice constant can be determined from the azimuthal peak positions.</p> <p>Umweganregung scan for <alternatives><inline-graphic mimetype="image" xlink:href="ark:/27927/pgg5f9jbbfq" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /><mml:math altimg="urn:x-wiley:15213951:media:pssb201350297:pssb201350297-math-0004" display="inline" overflow="scroll" xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mo stretchy="false">(</mml:mo><mml:mi mathvariant="italic">HK</mml:mi><mml:mo>.</mml:mo><mml:mi>L</mml:mi><mml:mo stretchy="false">)</mml:mo><mml:mo>=</mml:mo><mml:mo stretchy="false">(</mml:mo><mml:mn>00.1</mml:mn><mml:mo stretchy="false">)</mml:mo></mml:math></alternatives> (<alternatives><inline-graphic mimetype="image" xlink:href="ark:/27927/pgg5f9jbbg8" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /><mml:math altimg="urn:x-wiley:15213951:media:pssb201350297:pssb201350297-math-0005" display="inline" overflow="scroll" xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:mn>2</mml:mn><mml:mi>θ</mml:mi><mml:mo>=</mml:mo><mml:mn>17.02</mml:mn><mml:mtext>deg</mml:mtext></mml:math></alternatives>) of a hydrothermally grown ZnO substrate, excited with Cu K<sub>α1</sub> radiation. The pattern is symmetric with respect to zero angle representing the (10.0) azimuth. <inline-graphic xlink:href="ark:/27927/pgg5f9jc27r" content-type="pssb201350297-gra-0001" xlink:type="simple" xmlns:xlink="http://www.w3.org/1999/xlink" /></p> </sec> </abstract> … (more)
- Is Part Of:
- Physica status solidi. Volume 251:Issue 4(2014:Apr.)
- Journal:
- Physica status solidi
- Issue:
- Volume 251:Issue 4(2014:Apr.)
- Issue Display:
- Volume 251, Issue 4 (2014)
- Year:
- 2014
- Volume:
- 251
- Issue:
- 4
- Issue Sort Value:
- 2014-0251-0004-0000
- Page Start:
- 850
- Page End:
- 863
- Publication Date:
- 2014-01-27
- Subjects:
- Solid state physics -- Periodicals
Solids -- Periodicals
Atomic structure -- Periodicals
530.41 - Journal URLs:
- http://onlinelibrary.wiley.com/journal/10.1002/(ISSN)1521-3951 ↗
http://onlinelibrary.wiley.com/ ↗ - DOI:
- 10.1002/pssb.201350297 ↗
- Languages:
- English
- ISSNs:
- 0370-1972
- Deposit Type:
- Legaldeposit
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- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 6475.230000
British Library DSC - BLDSS-3PM
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- 3416.xml