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APA Citation
Beyer, K. A., Zhao, H., Borkiewicz, O. J., Newton, M. A., Chupas, P. J., & Chapman, K. W. (n.d.). simultaneous diffuse reflection infrared spectroscopy and X‐ray pair distribution function measurements. Journal of applied crystallography, 47, 95–101. http://access.bl.uk/ark:/81055/vdc_100024778329.0x000056