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Beyer, K. et al. (n.d.). Simultaneous diffuse reflection infrared spectroscopy and X‐ray pair distribution function measurements. Journal of applied crystallography. pp. 95-101. [Online].
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Beyer, K. et al. (n.d.). Simultaneous diffuse reflection infrared spectroscopy and X‐ray pair distribution function measurements. Journal of applied crystallography. pp. 95-101. [Online].