Cite
MLA Citation
P. Periwal et al.. “Interfacial abruptness in axial Si/SiGe heterostructures in nanowires probed by scanning capacitance microscopy.” Physica status solidi, vol. 211, no. 2, n.d., pp. 509–513. http://access.bl.uk/ark:/81055/vdc_100024774504.0x00002a