Cite
HARVARD Citation
Periwal, P. et al. (n.d.). Interfacial abruptness in axial Si/SiGe heterostructures in nanowires probed by scanning capacitance microscopy. Physica status solidi. 211 (2), pp. 509-513. [Online].
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Periwal, P. et al. (n.d.). Interfacial abruptness in axial Si/SiGe heterostructures in nanowires probed by scanning capacitance microscopy. Physica status solidi. 211 (2), pp. 509-513. [Online].