Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs). (30th June 2010)

Record Type:: Book
Title:: Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs). (30th June 2010)
Main Title:: Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Authors:: British Standards Institution,
Publisher Details:: London : British Standards Institution
Publication Date:: 2010
Extent:: 1 online resource (12 pages)
Subjects:: 602.1841
Transistors
Metals
Semiconductor devices
Thermal testing
Ions
Semiconductors
Field-effect transistors
Migration (chemical)
Electrical measurement
Oxides
Languages:: English
Related ISBNs:: 9780580586224
ISSNs:: 3016-3753
Access Rights:: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:: Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:: British Library HMNTS - ELD.DS.746359
Ingest File:: 16_007.xml