Cite
MLA Citation
Yuridia Caire and Russell L Parr. Intellectual property : valuation, exploitation, and infringement damages.. Hoboken, New Jersey : John Wiley & Sons, Inc, 2021. http://access.bl.uk/ark:/81055/vdc_100119101794.0x000001
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Yuridia Caire and Russell L Parr. Intellectual property : valuation, exploitation, and infringement damages.. Hoboken, New Jersey : John Wiley & Sons, Inc, 2021. http://access.bl.uk/ark:/81055/vdc_100119101794.0x000001