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MLA Citation
British Standards Institution,. BS EN IEC 60749-39. Semiconductor devices. Mechanical and climatic test methods.. London : British Standards Institution, 2020. http://access.bl.uk/ark:/81055/vdc_100108873895.0x000001
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British Standards Institution,. BS EN IEC 60749-39. Semiconductor devices. Mechanical and climatic test methods.. London : British Standards Institution, 2020. http://access.bl.uk/ark:/81055/vdc_100108873895.0x000001