Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices. (30th October 1987)

• Record Type: Book
• Authors: British Standards Institution,
• Publisher Details: London : British Standards Institution
• Publication Date: 1987
• Extent: 1 online resource (96 pages)
• Subjects: 602.1841; Electrical measurement; Orientation; Heat of activation; Inspection; Accelerated testing; Capacitance measurement; Breakdown voltage; Sampling methods; Quality assurance systems; Transistors; Marking; Semiconductor diodes; Capability approval; Electrical testing; Test equipment; Semiconductor rectifiers; Thyristors; Circuits; Designations; Testing conditions; Acceptance (approval); Thermal testing; Noise (spurious signals); Mechanical testing; Approval testing; Electronic equipment and components; Environmental testing; Qualification approval; Performance testing; Semiconductor devices; Voltage measurement; Transient voltages; Current measurement; Colour codes; Visual inspection (testing); Power measurement (electric); Statistical quality control; Assessed quality; Specification (approval); Endurance testing; Quality control; Leak tests
• Languages: English
• Related ISBNs: 058016263X
• ISSNs: 0017-2970
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.