Cite
HARVARD Citation
Celano, U. (eds.) (2019) Electrical Atomic Force Microscopy for Nanoelectronics. [Online]. Cham : Springer. Available from: http://access.bl.uk/ark:/81055/vdc_100085925309.0x000001
This is an interim version of our Electronic Legal Deposit Catalogue-eJournals and eBooks while we continue to recover from a cyber-attack.
Celano, U. (eds.) (2019) Electrical Atomic Force Microscopy for Nanoelectronics. [Online]. Cham : Springer. Available from: http://access.bl.uk/ark:/81055/vdc_100085925309.0x000001