Electrical Atomic Force Microscopy for Nanoelectronics. (2019)

• Record Type: Book
• Further Information: Note: Umberto Celano.
• Editors: Celano, Umberto
• Contents: Introduction (U. Celano, W. Vandervorst).- Conductive AFM for nanoscale analysis of high-k dielectric metal oxides (C. Rodenbücher, M. Wojtyniak, K. Szot).- Mapping Conductance and Carrier Distribution in Confined Three-Dimensional Transistor Structures (A. Schulze, P. Eyben, K. Paredis, L. Wouters, U. Celano, W. Vandervorst).- Scanning Capacitance Microscopy for two-dimensional carrier profiling of semiconductor devices (J. Mody, J. Nxumalo).- Scanning probe lithography for nanopatterning and fabrication of high-resolution devices (Y. K. Ryu, A. W. Knoll).- Characterizing Ferroelectricity with an Atomic Force Microscopy: an all-around technique (S. Martin, B. Gautier, N. Baboux, A. Gruvermann, A. Carretero-Genevrier, M. Gich, A. Gomez).- Electrical AFM for the analysis of Resistive Switching (S. Brivio, J. Frascaroli, M. H. Lee).- Magnetic force microscopy for magnetic recording and devices (A. Hirohata, M. Samiepour, M. Corbetta).- Nanoscale space charge density profiling with KPFM and photoconductive C-AFM/KPFM (C. Villeneuve-Faure, K. Makasheva, L. Boudou, G. Teyssedre).- Electrical AFM of 2D materials and heterostructures for nanoelectronics (F. Giannazzo, G. Greco, F. Roccaforte, C. Mahata, M. Lanza).- Diamond probes technology (T. Hantschel, T. Conard, J. Kilpatrick, G. Cross).- Scanning Microwave Impedance Microscopy (sMIM) in electronic materials and quantum materials (K. Rubin, Y. Yang, O. Amster, D. Scrymgeour, S. Misra).
• Publisher Details: Cham : Springer
• Publication Date: 2019
• Copyright Date: 2019
• Extent: 1 online resource (408 pages)
• Subjects: Physics; Surfaces (Physics); Electronics; Optical materials; Nanotechnology; Technology & Engineering -- Material Science; Technology & Engineering -- Electronics -- General; Science -- Nanostructures; Technology & Engineering -- Nanotechnology & MEMS; Testing of materials; Electronics engineering; Electronic devices & materials; Nanotechnology; Science -- Spectroscopy & Spectrum Analysis; Spectrum analysis, spectrochemistry, mass spectrometry
• Languages: English
• ISBNs: 9783030156121
• Related ISBNs: 9783030156114
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.