Cite
APA Citation
Zhang, Z., (Computer scientist), S., Tian, Y., Albu, A. B., Sidère, N., & Escalante, H. J. (Eds.) (2019). Patten recognition and informaiton forensics : ICPR 2018 International Workshops, CVAUI, IWCF, and MIPPSNA, Beijing, China, August 20-24, 2018, revised and selected papers. Cham, Switzerland : Springer. http://access.bl.uk/ark:/81055/vdc_100074823903.0x000001