Circuit design for reliability. ([2014])

• Record Type: Book
• Further Information: Note: Ricardo Reis, Yu Cao, Gilson Wirth, editors.
• Editors: Reis, Ricardo A. L (Ricardo Augusto da Luz); (Computer scientist), Cao, Yu; Wirth, Gilson
• Contents: Introduction -- Recent Trends in Bias Temperature Instability -- Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability -- Atomistic Simulations on Reliability -- On-chip characterization of statistical device degradation -- Circuit Resilience Roadmap -- Layout Aware Electromigration Analysis of Power/Ground Networks -- Power-Gating for Leakage Control and Beyond -- Soft Error Rate and Fault Tolerance Techniques for FPGAs.
• Publisher Details: New York, NY : Springer
• Publication Date: 2014
• Copyright Date: 2015
• Extent: 1 online resource (vi, 272 pages), illustrations (some color)
• Subjects: 621.3815; Engineering; Integrated circuits -- Design and construction; Integrated circuits -- Reliability; TECHNOLOGY & ENGINEERING -- Mechanical; Integrated circuits -- Design and construction; Integrated circuits -- Reliability; Electrical & Computer Engineering; Engineering & Applied Sciences; Electrical Engineering; Technology & Engineering -- Quality Control; Computers -- CAD-CAM; Reliability engineering; Computer-aided design (CAD); Systems engineering; System safety; Computer aided design; Technology & Engineering -- Electronics -- Circuits -- General; Circuits & components; Electronic books
• Languages: English
• ISBNs: 9781461440789; 1461440785; 1461440777; 9781461440772
• Related ISBNs: 9781461440772
• Notes: Note: Online resource; title from PDF title page (SpringerLink, viewed December 3, 2014).
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.