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APA Citation
Hinrichs, K., & Eichhorn, K. (Eds.) (2018). Ellipsometry of functional organic surfaces and films. Cham, Switzerland : Springer. http://access.bl.uk/ark:/81055/vdc_100072714675.0x000001
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Hinrichs, K., & Eichhorn, K. (Eds.) (2018). Ellipsometry of functional organic surfaces and films. Cham, Switzerland : Springer. http://access.bl.uk/ark:/81055/vdc_100072714675.0x000001