Silicon analog components : device design, process integration, characterization, and reliability /: device design, process integration, characterization, and reliability. (2015)

• Record Type: Book
• Further Information: Note: Badih El-Kareh, Lou N. Hutter.
• Authors: El-Kareh, Badih; Hutter, Lou N
• Contents: The World Is Analog -- Review of Single-Crystal Silicon Properties -- PN Junctions -- Rectifying and Ohmic Contacts -- Bipolar and Junction Field-Effect Transistors -- High-Voltage and Power Transistors -- Passive Components -- Process Integration -- Mismatch and Noise -- Chip Reliability.
• Publisher Details: New York, NY : Springer
• Publication Date: 2015
• Copyright Date: 2015
• Extent: 1 online resource (xli, 607 pages), illustrations
• Subjects: 621.3815; Engineering; Analog integrated circuits -- Materials; TECHNOLOGY & ENGINEERING -- Mechanical; Engineering; Optical materials; Systems engineering; Electrical & Computer Engineering; Engineering & Applied Sciences; Electrical Engineering; Technology & Engineering -- Electronics -- Circuits -- General; Technology & Engineering -- Material Science; Circuits & components; Electronic devices & materials; Systems engineering; Optical materials; Electronic books; Electronic books
• Languages: English
• ISBNs: 9781493927517; 1493927515; 1493927507; 9781493927500
• Related ISBNs: 9781493927500
• Notes: Note: Includes bibliographical references and index.; Note: Online resource; title from PDF title page (SpringerLink, viewed June 10, 2015).
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.