Multi-run memory tests for pattern sensitive faults. ([2019])

• Record Type: Book
• Further Information: Note: Ireneusz Mrozek.
• Authors: Mrozek, Ireneusz
• Contents: Introduction to digital memory.- Basics of functional RAM testing.- Multi-cell faults.- Controlled random testing.- Multi-run tests based on background changing.- Multi-run tests based on address changing.- Multiple controlled random testing.- Pseudo exhaustive testing based on march tests.- Conclusion.
• Publisher Details: Cham : Springer
• Publication Date: 2019
• Copyright Date: 2019
• Extent: 1 online resource
• Subjects: 621.38152; Engineering; Semiconductor storage devices -- Testing; Computer storage devices -- Testing; Random access memory -- Testing; TECHNOLOGY & ENGINEERING / Mechanical; Computer storage devices -- Testing; Random access memory -- Testing; Semiconductor storage devices -- Testing; Computers -- Systems Architecture -- General; Technology & Engineering -- Electronics -- General; Computer architecture & logic design; Electronics engineering; Systems engineering; Computer science; Electronics; Technology & Engineering -- Electronics -- Circuits -- General; Circuits & components; Electronic books
• Languages: English
• ISBNs: 9783319912042; 3319912046
• Related ISBNs: 9783319912035
• Notes: Note: Includes bibliographical references and index.; Note: Online resource; title from PDF title page (EBSCO, viewed July 12, 2018).
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.