Integrated circuit quality and reliability. ([2018?])

• Record Type: Book
• Further Information: Note: Eugene R. Hnatek.
• Authors: Hnatek, Eugene R
• Contents: Pt. 1. Introduction to integrated circuit manufacturing processes -- pt. 2. Impact of new technologies -- pt. 3. Contamination and manufacturing errors -- pt. 4. Causes (sources) of IC failures -- pt. 5. Introduction to screening.
• Edition: 2nd ed., rev. and expanded
• Publisher Details: Boca Raton : CRC Press
• Publication Date: 2018
• Copyright Date: 1995
• Extent: 1 online resource (xiii, 786 pages), illustrations
• Subjects: 621.3815; Integrated circuits -- Reliability; TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- Integrated; TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- General; Integrated circuits -- Reliability; Electronic books
• Languages: English
• ISBNs: 9781482277715; 1482277719
• Related ISBNs: 9780824792831; 0824792831
• Notes: Note: Includes bibliographical references and index.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.