Soft errors : from particles to circuits /: from particles to circuits. (2015)

• Record Type: Book
• Further Information: Note: Jean-Luc Autran, Daniela Munteanu.
• Authors: Autran, Jean-Luc; Munteanu, Daniela
• Contents: Foreword Preface Acknowledgments Authors Editor Introduction Glossary ENVIRONMENTS: DEFINITION AND METROLOGY Terrestrial Cosmic Rays and Atmospheric Radiation Background Primary Cosmic Rays Historical Background Extragalactic and Galactic Cosmic Rays (GCRs) Solar Wind and Solar Energetic Particles Magnetospheric Cosmic Rays Secondary Cosmic Rays in the Atmosphere and at Ground Level Development of Air Showers Modulation Factors of Particle Production in the Atmosphere and at Ground Level Radiation Environment at Ground Level (Particles, Flux, Variations, Shielding) Particle Fluxes at Sea Level Flux Variations Shielding Issues Synthesis Tools, Codes, and Models to Simulate Atmospheric and Terrestrial CRs SEUTEST EXPACS (PARMA Model) QARM CORSIKA PLANETOCOSMICS CRY References Detection and Characterization of Atmospheric Neutrons at Terrestrial Level: Neutron Monitors Neutron Monitors (NM) Historical Background Neutron Monitor Design and Operation Neutron Monitor Detection Response Plateau de Bure Neutron Monitor PdBNM Design PdBNM Installation and Operation Connection to the Neutron Monitor Database PdBNM Monte Carlo Simulation Concluding Remarks References Natural Radioactivity of Electronic Materials Radioactivity Radioactive Decay Alpha-Particle Emission Radioactive Nuclides in Nature Primordial Radionuclides Uranium Decay Chain Thorium Decay Chain Cosmic-Ray-Produced Radionuclides Radon Radionuclides and Radioactive Contamination in Advanced CMOS Technologies Alpha Radiation from Interconnect Metallization and Packaging Materials Emissivity Model Analytical Model for Monolayers Analytical Model for Multilayer Stack Universal Nomogram for Bulk Silicon References Alpha-Radiation Metrology in Electronic Materials Introduction Alpha-Particle Detection Techniques: Terms and Definitions Gas-Filled Counters Principle of Operation Ionization Counters Proportional Counters Ultralow-Background Alpha Counter Design and Operation of the UltraLo-1800 Signal Generation and Rejection Pulse and Event Classification Cosmogenics and Radon Issues Example of Measurements Multicenter Comparison of Alpha-Particle Measurements Other Techniques Silicon Alpha Detectors Liquid and Solid-State Scintillators ICP-MS and VPD ICP-MS References SOFT ERRORS: MECHANISMS AND CHARACTERIZATION Particle Interactions with Matter and Mechanisms of Soft Errors in Semiconductor Circuits Interactions of Neutrons with Matter Cross Section Types of Neutron–Matter Interactions Recoil Products Interaction of Thermal Neutrons with 10B Atmospheric Neutron–Silicon Interaction Databases Interactions of Charged Particles with Matter Ionization Stopping Power Range Alpha Particles Heavy Ions Electrons Interaction of Protons with Matter Interaction of Pions with Matter Interaction of Muons with Matter Basic Mechanisms of Single-Event Effects on Microelectronic Devices Charge Deposition (or Generation) Charge Transport Charge Collection SEU Mechanisms in Memories (Single-Bit Upset and Multiple-Cell Upset) SEE Mechanisms in Digital Circuits Sequential Logic Combinational Logic References Accelerated Tests Introduction Methodology and Test Protocols SEU Cross Section Test Equipment Requirements Test Plan Test Conditions Experiments Using Intense Beams of Particles High-Energy Neutrons Thermal Neutrons Protons Muons Alpha-Particle Accelerated Tests Using Solid Sources Evaluation of Various Neutron Broad-Spectrum Sources from a Simulation Viewpoint Simulation Details Nuclear Event Analysis Implications for the Soft-Error Rate References Real-Time (Life) Testing Introduction Real-Time Testing Methodology Instrumentation Issues Differentiation of the SER Components Statistics for RTSER: Typical Example Metrology of Atmospheric Neutron Flux Survey of a Few Recent RTSER Experiments IBM Intel Sony Tohoku University, Hitachi, and Renesas Electronics Cypress Xilinx NXP RTSER Experiments Conducted at ASTEP and LSM ASTEP and LSM Test Platforms RTSER Experiments Comparison with Accelerated Tests References SOFT ERRORS: MODELING AND SIMULATION ISSUES Modeling and Simulation of Single-Event Effects in Devices and Circuits Interest in Modeling and Simulation Main Approaches of Electrical Simulation at Device Level Main Simulation Approaches at Circuit Level Device-Level Simulation Transport Models Emerging Physical Effects TCAD Simulation Analytical and Compact Model Approaches Circuit-Level Simulation Approaches SPICE-Like Circuit Simulation Mixed-Mode Approach Full Numerical Simulation in the 3D Device Domain References Soft-Error Rate (SER) Monte Carlo Simulation Codes General-Purpose Monte Carlo Radiation-Transport Codes Review of Recent Monte Carlo Codes Dedicated to the SER Issue Intel Radiation Tool (IRT) PHITS-HyENEXSS Code System TIARA-G4 Detailed Description of the TIARA-G4 Code Circuit Architecture Construction Module Radiation-Event Generator Interaction, Transport, and Tracking Module SRAM Electrical-Response Module Soft-Error Rate Calculation Module Experimental versus Simulation Results: Discussion Impact of Thermal and Low-Energy Neutrons on a 40 nm SRAM Circuit Comparison between TIARA and TIARA-G4: Impact of the BEOL on the SER SER Estimation of a 65 nm SRAM under High-Energy Atmospheric Neutrons Effects of Low-Energy Muons on a 65 nm SRAM Circuit References SOFT ERRORS IN EMERGING DEVICES AND CIRCUITS Scaling Effects and Their Implications for Soft Errors Introduction Feature-Size Scaling Geometric Scaling Ion-Track Spatial Structure versus Device Dimensions Carrier Channeling in Wells and Electrical Related Effects Variability and SEE Critical Charge Increasing Sensitivity to Background Radiation Low-Energy Protons Atmospheric Muons Low-Alpha-Material Issue Trends and Summary for Ultrascaled Technologies References Natu
• Edition: 1st
• Publisher Details: Boca Raton : CRC Press
• Publication Date: 2015
• Extent: 1 online resource, illustrations (black and white)
• Subjects: 621.3815; Digital integrated circuits -- Design and construction; Integrated circuits -- Effect of radiation on; Soft errors (Computer science)
• Languages: English
• ISBNs: 9781466590847
• Related ISBNs: 9781466590830
• Notes: Note: Description based on CIP data; item not viewed.
• Access Rights: Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
• Access Usage: Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.