1. Experimentally verified drain‐current model for variable barrier transistor. Issue 17 (5th August 2015) Authors: Moldovan, O.; Lime, F.; Barraud, S.; Smaani, B.; Latreche, S.; Iñiguez, B. Journal: Electronics letters Issue: Volume 51:Issue 17(2015) Page Start: 1364 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗