Subject: fault diagnosis -- automatic test pattern generation -- integrated circuit testing - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Subject fault diagnosis -- automatic test pattern generation -- integrated circuit testing

1. Updating the sets of target faults during test generation for multiple fault models. Issue 5 (27th March 2019)

Authors:: Pomeranz, Irith
Journal:: IET computers & digital techniques
Issue:: Volume 13:Issue 5(2019)
Page Start:: 369
Record Type:: Journal Article
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