Updating the sets of target faults during test generation for multiple fault models. Issue 5 (27th March 2019)
- Record Type:
- Journal Article
- Title:
- Updating the sets of target faults during test generation for multiple fault models. Issue 5 (27th March 2019)
- Main Title:
- Updating the sets of target faults during test generation for multiple fault models
- Authors:
- Pomeranz, Irith
- Abstract:
- Abstract : A comprehensive test set targets the detection of several fault models. As an example, in this study, stuck‐at faults, transition faults and four‐way bridging faults are targeted. Bridging faults represent a fault model where it is necessary to select a subset of target faults from all the possible faults. After test generation for single stuck‐at faults, undetectable single stuck‐at faults can be used for identifying undetectable transition and four‐way bridging faults. These faults can be removed from the sets of target faults to reduce the test generation effort. The new contribution of the study is related to the possibility of updating the set of target bridging faults again after test generation for transition faults. The analysis performed in the study leads to the premise that the presence of an undetectable or aborted transition fault on a line g makes bridging faults that are associated with line g less likely to be detected. As a result, line g may be covered by fewer bridging faults than selected for it, creating a test hole. To address this issue, the study suggests that more bridging faults should be selected for line g in this case. Experimental results are presented to support the discussion.
- Is Part Of:
- IET computers & digital techniques. Volume 13:Issue 5(2019)
- Journal:
- IET computers & digital techniques
- Issue:
- Volume 13:Issue 5(2019)
- Issue Display:
- Volume 13, Issue 5 (2019)
- Year:
- 2019
- Volume:
- 13
- Issue:
- 5
- Issue Sort Value:
- 2019-0013-0005-0000
- Page Start:
- 369
- Page End:
- 375
- Publication Date:
- 2019-03-27
- Subjects:
- fault diagnosis -- automatic test pattern generation -- integrated circuit testing
target faults -- test generation -- multiple fault models -- undetectable transition fault -- aborted transition fault -- four‐way bridging faults -- undetectable single stuck‐at faults
Computers -- Periodicals
Digital electronics -- Periodicals
Computer engineering -- Periodicals
Computer architecture -- Periodicals
Computer organization -- Periodicals
621.39 - Journal URLs:
- http://digital-library.theiet.org/content/journals/iet-cdt ↗
http://ieeexplore.ieee.org/servlet/opac?punumber=4117424 ↗
http://www.ietdl.org/IET-CDT ↗
https://ietresearch.onlinelibrary.wiley.com/journal/1751861x ↗
http://www.theiet.org/ ↗ - DOI:
- 10.1049/iet-cdt.2018.5111 ↗
- Languages:
- English
- ISSNs:
- 1751-8601
- Deposit Type:
- Legaldeposit
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library DSC - 4363.252300
British Library DSC - BLDSS-3PM
British Library HMNTS - ELD Digital store - Ingest File:
- 17104.xml