1. Double Hamming distance‐based 2D reordering method for scan‐in power reduction and test pattern compression. Issue 7 (1st March 2020) Authors: Zhang, Minghe; Kuang, Jishun; Huang, Jing Journal: Electronics letters Issue: Volume 56:Issue 7(2020) Page Start: 352 Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗