Double Hamming distance‐based 2D reordering method for scan‐in power reduction and test pattern compression. Issue 7 (1st March 2020)

• Record Type: Journal Article
• Authors: Zhang, Minghe; Kuang, Jishun; Huang, Jing
• Is Part Of: Electronics letters. Volume 56:Issue 7(2020)
• Page Start: 352
• Page End: 354
• Publication Date: 2020-03-01
• Subjects: data compression -- runlength codes -- Hamming codes; compress test patterns -- reordering‐based methods -- reordering process -- logical state transitions -- code‐based test pattern compression -- double Hamming distance -- 2D reordering method -- scan‐in power reduction -- minimum transition filling scheme -- alternating shifted frequency directed run‐length coding; Electronics -- Periodicals; 621.381
• DOI: 10.1049/el.2019.3225
• Languages: English
• ISSNs: 0013-5194

Abstract

Abstract : A double Hamming distance‐based 2D reordering method is proposed for a test set with don't care bits ( X s) to reduce scan‐in power and compress test patterns. In this method, the rows and columns in the test set are reordered sequentially so that similar rows or columns are aggregated together. Being different from other reordering‐based methods, the authors' method reorders every two rows or columns with more identical bits closer in the whole reordering process, where more X s are clustered. Each X is then replaced with 0 or 1 using minimum transition filling scheme to minimise '1‐0' and '0‐1' logical state transitions. A small number of the logic state transitions cause low switching activity, which not only reduces scan‐in power consumption but also facilitates code‐based test pattern compression. Experimental results show that their proposed method achieves peak and average power reductions of 18.01 and 12.97% compared to the state‐of‐the‐art method, respectively. Furthermore, the compression ratio of alternating shifted frequency directed run‐length coding is improved to 73.76% in average utilising their proposed method.