1. Flow Patterns: Numerical Simulations and In Situ Optical Microscopy Connecting Flow Pattern, Crystallization, and Thin‐Film Properties for Organic Transistors with Superior Device‐to‐Device Uniformity (Adv. Mater. 48/2020). Issue 48 (1st December 2020) Authors: Lee, Jeong‐Chan; Lee, Minho; Lee, Ho‐Jun; Ahn, Kwangguk; Nam, Jaewook; Park, Steve Journal: Advanced materials Issue: Volume 32:Issue 48(2020) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Numerical Simulations and In Situ Optical Microscopy Connecting Flow Pattern, Crystallization, and Thin‐Film Properties for Organic Transistors with Superior Device‐to‐Device Uniformity. Issue 48 (20th October 2020) Authors: Lee, Jeong‐Chan; Lee, Minho; Lee, Ho‐Jun; Ahn, Kwangguk; Nam, Jaewook; Park, Steve Journal: Advanced materials Issue: Volume 32:Issue 48(2020) Page Start: n/a Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗