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You searched for: Subject atomic layer deposition -- FinFET -- metal gate -- TaAlC -- work function

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1. Investigation of Thermal Atomic Layer Deposited TaAlC with Low Effective Work-Function on HfO2 Dielectric Using TaCl5 and TEA as Precursors. (17th December 2016)

2. Investigation of Thermal Atomic Layer Deposited TaAlC with Low Effective Work-Function on HfO2 Dielectric Using TaCl5 and TEA as Precursors. (1st January 2017)