Subject: VDMOS -- Capacitive loads -- Failure mechanism -- Thermal characteristics -- Structure -- Process - British Library Electronic Legal Deposit Catalogue-Journal Issues and Articles Search Results

Subject VDMOS -- Capacitive loads -- Failure mechanism -- Thermal characteristics -- Structure -- Process

Authors:: Zhang, Yulong; Wang, Lulu; Gong, Xueqin; Gao, Bo; Wang, Lixin; Luo, Jiajun
Journal:: Microelectronics and reliability
Issue:: Volume 93(2019)
Page Start:: 8
Record Type:: Journal Article
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