1. A triple-node-upset self-recoverable design based on Schmitt-triggers and C-elements. (May 2023) Authors: Xu, Hui; Liu, Chaoming; Ma, Ruijun; Liang, Huaguo; Huang, Zhengfeng; Zhou, Jing; Zhu, Shuo Journal: Microelectronics and reliability Issue: Volume 144(2023) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗