31. Rules for the preparation of detail specifications for semiconductor devices of assessed quality: low noise, low power microwave transistors. (31st December 1989) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (12 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
32. Semiconductor devices. Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET). Fast BTI test for MOSFET Part 1, (30th March 2023) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (26 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
33. Semiconductor devices. Constant current electromigration test. (31st July 2010) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
34. Semiconductor devices. Discrete devices. Bipolar transistors Part 7, (23rd October 2019) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (104 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
35. Semiconductor devices. Discrete devices. Field-effect transistors Part 8, (9th July 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (88 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
36. Semiconductor devices. Discrete devices. Insulated-gate bipolar transistors (IGBTs) Part 9, (22nd November 2019) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (82 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
37. Semiconductor devices. Discrete devices. Microwave diodes and transistors Part 4, (26th May 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (140 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
38. Semiconductor devices. Discrete devices. Recommendations for field-effect transistors Part 1.8, (30th April 1985) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (56 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
39. Semiconductor devices. Flexible and stretchable semiconductor devices. Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells Part 9, (20th December 2022) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (22 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
40. Semiconductor devices. Hot carrier test on MOS transistors. (31st July 2010) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗