1. BS IEC 63275-1 Ed.1.0. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors. Part 1. Test method for bias temperature instability (1st April 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (11 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL binary counter circuits. General application category. (1st December 1973) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL binary memory circuits. General application category. (1st December 1975) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (20 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL digital bistable circuits. General application category. (1st December 1972) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL digital gate circuits. General application category. (1st December 1975) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (11 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL digital interconnected gate circuits. General application category. (18th October 1985) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL digital inverter circuits. General application category. (1st December 1975) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors. Test method for bias temperature instability Part 1, (5th October 2022) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS. (2nd June 1987) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (23 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗