1. Fault protection for a SiC MOSFET based on gate voltage subjected to short circuit type II. (April 2020) Authors: Liao, Xinglin; Shen, Qiping; Hu, Yaogang; Yang, Chao; Chen, Xingang; Li, Hui Journal: Microelectronics and reliability Issue: Volume 107(2020) Page Start: Record Type: Journal Article View Content: Available online (eLD content is only available in our Reading Rooms) ↗