1. Atomic switch : from invention to practical use and future prospects /: from invention to practical use and future prospects. ([2020]) Editors: Aono, Masakazu Record Type: Book Extent: 1 online resource (270 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. BS EN 60947-10. Low-voltage switchgear and controlgear. Part 10. Semiconductor Circuit-Breakers (5th May 2022) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (142 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. BS EN IEC 62951-8. Semiconductor devices. Flexible and stretchable semiconductor devices. Part 8. Test method for stretchability, flexibility and stability of flexible resistive memory (21st August 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. BS IEC 60747-18-4. Semiconductor devices. Part 18-4. Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors (7th May 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. BS IEC 60947-10. Low-voltage switchgear and controlgear. Part 10. Semiconductor Circuit-Breakers (5th July 2023) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (127 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. BS IEC 63287-2 Ed.1.0. Semiconductor devices. Guidelines for reliability qualification plans. Part 2. Concept of mission profile (9th February 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Electronic components. Long-term storage of electronic semiconductor devices. Special cases Part 9, (11th October 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (22 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. Semiconductor devices. Flexible and stretchable semiconductor devices. Test method for stretchability, flexibility, and stability of flexible resistive memory Part 8, (24th January 2023) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Semiconductor devices. Guidelines for reliability qualification plans. Concept of mission profile Part 2, (23rd May 2023) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (22 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Semiconductor devices. Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors Part 18-4, (27th March 2023) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (18 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗