1. Rules for the preparation of detail specifications for fusible link programmable read-only memories of assessed quality (full assessment level). (15th October 1981) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (19 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Integrated circuits. Memory devices pin configurations. (15th September 1999) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (24 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. BS EN 60747-16-7. Semiconductor devices. Part 16-7. Microwave integrated circuits. Attenuators (5th March 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (36 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
4. BS EN 60747-16-8. Semiconductor devices. Part 16-8. Microwave integrated circuits. Limiters (5th March 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (36 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
5. Semiconductor devices. Mechanical and climatic test methods. Storage at high temperature Part 6, (24th November 2017) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (12 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
6. BS IEC 60747-18-4. Semiconductor devices. Part 18-4. Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors (7th May 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
7. Electronic components. Long-term storage of electronic semiconductor devices. Special cases Part 9, (11th October 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (22 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
8. BS EN IEC 60747-5-16. Semiconductor devices. Part 5-16. Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the photocurrent spectroscopy (7th December 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (19 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
9. Semiconductor devices. Microwave integrated circuits. Limiters Part 16-8, (25th May 2023) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (44 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
10. Semiconductor devices. Microwave integrated circuits. Attenuators Part 16-7, (25th May 2023) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (50 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗