21. Semiconductor converters. General requirements and line commutated converters. Application guide Part 1-2, (13th November 2019) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (108 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
22. Semiconductor convertors. General requirements and line commutated convertors. Self-commutated semiconductor converters including direct d.c. converters Part 2, (15th August 2000) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (50 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
23. Semiconductor convertors. General requirements and line commutated convertors. Transformers and reactors Part 1-3, (15th May 1993) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
24. Semiconductor devices. Micro-electromechanical devices. Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever Part 42, (24th October 2022) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (24 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
25. Semiconductor devices. Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on the room-temperature reference point Part 5-10, (14th January 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (20 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
26. Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient rated thyristors. (15th February 1983) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (22 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
27. Specification for harmonized system of quality assessment for electronic components. Blank detail specification: case-rated thyristors. (15th July 1983) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (22 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
28. Specification for harmonized system of quality assessment for electronic components. Blank detail specification: reverse blocking triode thyristors, ambient and case-rated, for currents greater than 100 A. (15th March 1994) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
29. Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bidirectional triode thyristors (triacs), ambient or case-rated, up to 100 A. (31st January 1992) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
30. Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Reverse blocking triode thyristors, ambient and case-rated, up to 100 A. (15th February 1990) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗