21. BS EN IEC 60747-15. Semiconductor devices. Part 15. Isolated power semiconductor devices. Discrete devices (5th July 2023) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (55 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
22. BS EN IEC 60747-16-7. Semiconductor devices. Part 16-7. Microwave integrated circuits. Attenuators (18th December 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (39 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
23. BS EN IEC 60747-18-5. Semiconductor devices. Part 18-5. Semiconductor bio sensors. Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light (7th May 2021) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (13 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
24. BS EN IEC 60747-2. Semiconductor devices. Part 2. Discrete devices. Rectifier diodes (21st June 2023) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (50 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
25. BS EN IEC 60747-5-14. Semiconductor devices. Part 5-14. Optoelectronic devices. Light emitting diodes. Test method of the surface temperature based on the thermoreflectance method (28th August 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (22 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
26. BS EN IEC 60747-5-15. Semiconductor devices. Part 5-15. Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage based on the electroreflectance spectroscopy (28th August 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (16 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
27. BS EN IEC 60747-5-4. Semiconductor devices. Part 5-4. Optoelectronic devices. Semiconductor lasers (1st November 2019) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (33 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
28. BS EN IEC 60747-6. Semiconductor devices. Part 6. Discrete devices. Thyristors (21st June 2023) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (126 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
29. BS EN IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods. Part 37. Board level drop test method using an accelerometer (23rd October 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (24 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
30. BS EN IEC 60749-39. Semiconductor devices. Mechanical and climatic test methods. Part 39. Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components (23rd October 2020) Authors: British Standards Institution, Record Type: Book Extent: 1 online resource (14 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗