BS EN IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods. Part 37. Board level drop test method using an accelerometer (23rd October 2020)

Record Type:
Book
Title:
BS EN IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods. Part 37. Board level drop test method using an accelerometer (23rd October 2020)
Main Title:
BS EN IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods.
Authors:
British Standards Institution,
Publisher Details:
London : British Standards Institution
Publication Date:
2020
Extent:
1 online resource (24 pages)
Subjects:
602.1841
Printed-circuit boards
Electronic equipment and components
Integrated circuits
Surface mounting devices
Accelerated testing
Environmental testing
Drop tests
Semiconductor devices
Mechanical testing
Impact testing
Languages:
English
ISSNs:
3042-5836
Access Rights:
Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
Access Usage:
Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
View Content:
Available online (eLD content is only available in our Reading Rooms) ↗
Physical Locations:
British Library HMNTS - ELD.DS.567596
Ingest File:
03_200.xml