1. Aberration-corrected electron microscopy. (2017) Other Names: Hawkes, P. W Record Type: Book Extent: 1 online resource (360 pages) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
2. Advances in imaging and electron physicas. Aberration-corrected electron microscopy / v. 153, (2008) Other Names: Hawkes, P. W Record Type: Book Extent: 1 online resource (xv, 538 pages, [32] pages of plates), illustrations (some color) View Content: Available online (eLD content is only available in our Reading Rooms) ↗
3. Electron nano-imaging : basics of imaging and diffraction for TEM and STEM /: basics of imaging and diffraction for TEM and STEM. (2017) Authors: Tanaka, Nobuo Record Type: Book Extent: 1 online resource (xxviii, 333 pages), illustrations (some color) View Content: Available online (eLD content is only available in our Reading Rooms) ↗