Advances in imaging and electron physicas. Aberration-corrected electron microscopy / v. 153, (2008)
- Record Type:
- Book
- Title:
- Advances in imaging and electron physicas. Aberration-corrected electron microscopy / v. 153, (2008)
- Main Title:
- Advances in imaging and electron physicas.
- Other Titles:
- Aberration-corrected electron microscopy
- Further Information:
- Note: Edited by Peter W. Hawkes.
- Other Names:
- Hawkes, P. W
- Contents:
- History of direct aberration correction / Harald Rose -- Present and future hexapole aberration correctors for high-resolution electron microscopy / Maximilian Haider, Heiko Müller, and Stephan Uhlemann -- Advances in aberration-corrected scanning transmission electron microscopy and electron energy-loss spectroscopy / Ondrej L. Krivanek [and others] -- First results using the Nion third-order scanning transmission electron microscope corrector / P.E. Batson -- Scanning transmission electron microscopy and electron energy loss spectroscopy / Andrew L. Bleloch -- Aberration correction with the SACTEM-Toulouse / Florent Houdellier [and others] -- Novel aberration corrrection concepts / Bernd Kabius and Harald Rose -- Aberration-corrected imaging in conventional transmission electron microscopy and scanning transmission electron microscopy / Angus I. Kirkland [and others] -- Materials applications of aberration-corrected scanning transmission electron microscopy / S.J. Pennycook [and others] -- Spherical aberration-corrected transmission electron microscopy for nanomaterials / Nobuo Tanaka -- Atomic-resolution aberration-corrected transmission electron microscopy / Knut Urban [and others] -- Aberration-corrected electron microscopes at Brookhaven National Laboratory / Yimei Zhu and Joe Wall.
- Publisher Details:
- Amsterdam Boston : Academic Press
- Publication Date:
- 2008
- Extent:
- 1 online resource (xv, 538 pages, [32] pages of plates), illustrations (some color)
- Subjects:
- 502.8/25
Transmission electron microscopy
Scanning transmission electron microscopy
Aberration
SCIENCE -- Electron Microscopes & Microscopy
Aberration
Scanning transmission electron microscopy
Transmission electron microscopy
Electronic books - Languages:
- English
- ISBNs:
- 9780080880358
0080880355 - Notes:
- Note: Includes bibliographical references and index.
Note: Print version record. - Access Rights:
- Legal Deposit; Only available on premises controlled by the deposit library and to one user at any one time; The Legal Deposit Libraries (Non-Print Works) Regulations (UK).
- Access Usage:
- Restricted: Printing from this resource is governed by The Legal Deposit Libraries (Non-Print Works) Regulations (UK) and UK copyright law currently in force.
- View Content:
- Available online (eLD content is only available in our Reading Rooms) ↗
- Physical Locations:
- British Library HMNTS - ELD.DS.36542
- Ingest File:
- 01_067.xml